[Stoppi] has taken on a fascinating project involving the interference of thin layers, a phenomenon often observed in everyday life but rarely explored in such depth. This project delves into the ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

Accurately controlling film thickness and uniformity is extremely important for both throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. White ...

Thin films can be made from a variety of materials, including metals (e.g., gold, silver), oxides (e.g., silicon dioxide, titanium dioxide), and semiconductors (e.g ...

The major factors affecting the performance of crystalline thin films are the presence of grain boundaries and inherent crystal structure. Post-deposition annealing is frequently employed to improve ...

In this article, we explore how X-ray diffraction, also known as XRD, can be used to analyze thin films and the benefits of using this technique. Many materials are now processed in the form of thin ...